Dr Göksenin Yaralıoğlu received his PhD degree from Electrical and Electronics Engineering Department, Bilkent University in 1999. His thesis was on the noise analysis of Atomic Force Microscope. Between 1999 and 2006, he worked as an Engineering Research Associate at Stanford University. During his post-doc, he worked on Microelectromechanical systems (MEMS), ultrasound, material characterization and Atomic Force Microscopy. After his post-doc studies, he joined a start-up company where he worked as a MEMS design engineer. Later he directed test activities to calibrate MEMS inertial sensors in production in the same company. Dr Yaralıoğlu published his research in international journals and in book chapters. He holds seven patents.